A. M. Majid

2007
3	EE	David C. Keezer, C. Gray, A. M. Majid, N. Taher: Low-Cost Multi-Gigahertz Test Systems Using CMOS FPGAs and PECL CoRR abs/0710.4761: (2007)
2005
2	EE	A. M. Majid, David C. Keezer, J. V. Karia: A 5 Gbps Wafer-Level Tester. Asian Test Symposium 2005: 58-63
1	EE	David C. Keezer, C. Gray, A. M. Majid, N. Taher: Low-Cost Multi-Gigahertz Test Systems Using CMOS FPGAs and PECL. DATE 2005: 152-157

Coauthor Index

1	C. Gray	[1] [3]
2	J. V. Karia	[2]
3	David C. Keezer	[1] [2] [3]
4	N. Taher	[1] [3]