| |
| 2003 | ||
|---|---|---|
| 4 | EE | J. S. Davis, David C. Keezer, O. Liboiron-Ladouceur, K. Bergman: Application and Demonstration of a Digital Test Core: Optoelectronic Test Bed and Wafer-level Prober. ITC 2003: 166-174 |
| 2002 | ||
| 3 | EE | J. S. Davis, David C. Keezer: Multi-Purpose Digital Test Core Utilizing Programmable Logic. ITC 2002: 438-445 |
| 1998 | ||
| 2 | EE | David C. Keezer, K. E. Newman, J. S. Davis: Improved sensitivity for parallel test of substrate interconnections. ITC 1998: 228-233 |
| 1 | EE | J. S. Davis: Active help found beneficial in wizard of oz study. Information & Software Technology 40(2): 93-103 (1998) |
| 1 | K. Bergman | [4] |
| 2 | David C. Keezer | [2] [3] [4] |
| 3 | O. Liboiron-Ladouceur | [4] |
| 4 | K. E. Newman | [2] |