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R. J. Wenzel

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1997
2 David C. Keezer, R. J. Wenzel: Low-Cost ATE PinElectronics for Multigigabit-per-Second At-Speed Test. ITC 1997: 94-100
1992
1 David C. Keezer, R. J. Wenzel: Calibration Techniques for a Gigahertz Test System. ITC 1992: 530-537

Coauthor Index

1David C. Keezer [1] [2]

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