| 2008 |
|---|
| 6 | EE | David C. Keezer,
Dany Minier,
Patrice Ducharme:
Variable Delay of Multi-Gigahertz Digital Signals for Deskew and Jitter-Injection Test Applications.
DATE 2008: 1486-1491 |
| 2007 |
|---|
| 5 | EE | David C. Keezer,
Dany Minier,
Patrice Ducharme:
Method for reducing jitter in multi-gigahertz ATE.
DATE 2007: 701-706 |
| 2006 |
|---|
| 4 | EE | David C. Keezer,
Dany Minier,
Patrice Ducharme:
Source-Synchronous Testing of Multilane PCI Express and HyperTransport Buses.
IEEE Design & Test of Computers 23(1): 46-57 (2006) |
| 2004 |
|---|
| 3 | EE | David C. Keezer,
Dany Minier,
F. Binette:
Modular Extension of ATE to 5 Gbps.
ITC 2004: 748-757 |
| 2 | EE | David C. Keezer,
Dany Minier,
Marie-Christine Caron:
Multiplexing ATE Channels for Production Testing at 2.5 Gbps.
IEEE Design & Test of Computers 21(4): 288-301 (2004) |
| 2003 |
|---|
| 1 | EE | David C. Keezer,
Dany Minier,
Marie-Christine Caron:
A Production-Oriented Multiplexing System for Testing above 2.5 Gbps.
ITC 2003: 191-200 |
