K. E. Newman

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1998

2 EE David C. Keezer, K. E. Newman, J. S. Davis: Improved sensitivity for parallel test of substrate interconnections. ITC 1998: 228-233

1997

1 K. E. Newman, David C. Keezer: A Low-Cost Massively-Parallel Interconnect Test Method for MCM Substrates. ITC 1997: 370-378

1998
2	EE	David C. Keezer, K. E. Newman, J. S. Davis: Improved sensitivity for parallel test of substrate interconnections. ITC 1998: 228-233
1997
1		K. E. Newman, David C. Keezer: A Low-Cost Massively-Parallel Interconnect Test Method for MCM Substrates. ITC 1997: 370-378

Coauthor Index

1 J. S. Davis [2]

2 David C. Keezer [1] [2]