O. Liboiron-Ladouceur

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2003

1 EE J. S. Davis, David C. Keezer, O. Liboiron-Ladouceur, K. Bergman: Application and Demonstration of a Digital Test Core: Optoelectronic Test Bed and Wafer-level Prober. ITC 2003: 166-174

2003
1	EE	J. S. Davis, David C. Keezer, O. Liboiron-Ladouceur, K. Bergman: Application and Demonstration of a Digital Test Core: Optoelectronic Test Bed and Wafer-level Prober. ITC 2003: 166-174

Coauthor Index

1 K. Bergman [1]

2 J. S. Davis [1]

3 David C. Keezer [1]