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O. Liboiron-Ladouceur

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2003
1EEJ. S. Davis, David C. Keezer, O. Liboiron-Ladouceur, K. Bergman: Application and Demonstration of a Digital Test Core: Optoelectronic Test Bed and Wafer-level Prober. ITC 2003: 166-174

Coauthor Index

1K. Bergman [1]
2J. S. Davis [1]
3David C. Keezer [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)