J. V. Karia
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2005
1
EE
A. M. Majid
,
David C. Keezer
, J. V. Karia: A 5 Gbps Wafer-Level Tester.
Asian Test Symposium 2005
: 58-63
Coauthor
Index
1
David C. Keezer
[
1
]
2
A. M. Majid
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
