| |
| 2006 | ||
|---|---|---|
| 1 | EE | Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware: Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers. IEEE Design & Test of Computers 23(2): 100-109 (2006) |
| 1 | Brady Benware | [1] |
| 2 | W. Robert Daasch | [1] |
| 3 | Ritesh P. Turakhia | [1] |