Daniel Bockelman
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2000
1
W. Robert Daasch
,
James McNames
, Daniel Bockelman,
Kevin Cota
: Variance reduction using wafer patterns in I_ddQ data.
ITC 2000
: 189-198
Coauthor
Index
1
Kevin Cota
[
1
]
2
W. Robert Daasch
[
1
]
3
James McNames
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
