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Takuji Okamoto

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2007
12EEHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo: Detection of CMOS Open Node Defects by Frequency Analysis. IEICE Transactions 90-D(3): 685-687 (2007)
2005
11EEMasahiro Kawai, Yoichiro Sato, Hiroto Kagotani, Takuji Okamoto: Superconductive logic circuits constructed by the use of two thresholds of SQUID. Systems and Computers in Japan 36(2): 42-50 (2005)
2004
10EEMitsuyasu Kagiyama, Hiroyuki Michinishi, Hiroto Kagotani, Takuji Okamoto, Yasuo Ogasawara, Fumihiko Kajiya: Model analysis of coronary hemodynamics incorporating autoregulation. Systems and Computers in Japan 35(14): 21-31 (2004)
2003
9EEHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo: Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test. Asian Test Symposium 2003: 406-411
2002
8EEHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo: CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power Supply. Asian Test Symposium 2002: 417-422
2001
7EEHiroto Kagotani, Takuji Okamoto, Takashi Nanya: Synthesis of four-phase asynchronous control circuits from pipeline dependency graphs. ASP-DAC 2001: 425-430
2000
6EEYoichiro Sato, Yoshinobu Yamasoto, Masanori Saito, Hiroto Kagotani, Takuji Okamoto, Masahiro Kawai: Systematic reducing of metastable operations in CMOS D flip-flops. Systems and Computers in Japan 31(3): 20-28 (2000)
5EEHiroto Kagotani, Yoichiro Sato, Yoshimichi Takahara, Takuji Okamoto: A method of affine transformation for rectangular video image. Systems and Computers in Japan 31(7): 75-85 (2000)
1997
4EEHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara: Testing for the programming circuit of LUT-based FPGAs. Asian Test Symposium 1997: 242-247
1996
3EEHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara: A Test Methodology for Interconnect Structures of LUT-based FPGAs. Asian Test Symposium 1996: 68-74
1995
2EETomoo Inoue, Hideo Fujiwara, Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto: Universal test complexity of field-programmable gate arrays. Asian Test Symposium 1995: 259-265
1983
1 Takuji Okamoto, Hiroyuki Shibata, Kozo Kinoshita: Design of High-Level Test Language for Digital LSI. ITC 1983: 508-513

Coauthor Index

1Hideo Fujiwara [2] [3] [4]
2Tsutomu Hondo [8] [9] [12]
3Tomoo Inoue [2] [3] [4]
4Mitsuyasu Kagiyama [10]
5Hiroto Kagotani [5] [6] [7] [10] [11]
6Fumihiko Kajiya [10]
7Masahiro Kawai [6] [11]
8Kozo Kinoshita [1]
9Toshifumi Kobayashi [8] [9] [12]
10Hiroyuki Michinishi [2] [3] [4] [8] [9] [10] [12]
11Takashi Nanya [7]
12Yasuo Ogasawara [10]
13Masanori Saito [6]
14Yoichiro Sato [5] [6] [11]
15Hiroyuki Shibata [1]
16Yoshimichi Takahara [5]
17Yoshinobu Yamasoto [6]
18Tokumi Yokohira [2] [3] [4] [8] [9] [12]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)