| |
| 2000 | ||
|---|---|---|
| 1 | Tomoo Inoue, Debesh Kumar Das, Chiiho Sano, Takahiro Mihara, Hideo Fujiwara: Test Generation for Acyclic Sequential Circuits with Hold Registers. ICCAD 2000: 550-556 | |
| 1 | Debesh Kumar Das (Debesh K. Das) | [1] |
| 2 | Hideo Fujiwara | [1] |
| 3 | Tomoo Inoue | [1] |
| 4 | Takahiro Mihara | [1] |