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Chiiho Sano

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2000
1 Tomoo Inoue, Debesh Kumar Das, Chiiho Sano, Takahiro Mihara, Hideo Fujiwara: Test Generation for Acyclic Sequential Circuits with Hold Registers. ICCAD 2000: 550-556

Coauthor Index

1Debesh Kumar Das (Debesh K. Das) [1]
2Hideo Fujiwara [1]
3Tomoo Inoue [1]
4Takahiro Mihara [1]

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