| 2007 |
|---|
| 7 | EE | Hiroyuki Michinishi,
Tokumi Yokohira,
Takuji Okamoto,
Toshifumi Kobayashi,
Tsutomu Hondo:
Detection of CMOS Open Node Defects by Frequency Analysis.
IEICE Transactions 90-D(3): 685-687 (2007) |
| 2004 |
|---|
| 6 | EE | Mitsuyasu Kagiyama,
Hiroyuki Michinishi,
Hiroto Kagotani,
Takuji Okamoto,
Yasuo Ogasawara,
Fumihiko Kajiya:
Model analysis of coronary hemodynamics incorporating autoregulation.
Systems and Computers in Japan 35(14): 21-31 (2004) |
| 2003 |
|---|
| 5 | EE | Hiroyuki Michinishi,
Tokumi Yokohira,
Takuji Okamoto,
Toshifumi Kobayashi,
Tsutomu Hondo:
Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test.
Asian Test Symposium 2003: 406-411 |
| 2002 |
|---|
| 4 | EE | Hiroyuki Michinishi,
Tokumi Yokohira,
Takuji Okamoto,
Toshifumi Kobayashi,
Tsutomu Hondo:
CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power Supply.
Asian Test Symposium 2002: 417-422 |
| 1997 |
|---|
| 3 | EE | Hiroyuki Michinishi,
Tokumi Yokohira,
Takuji Okamoto,
Tomoo Inoue,
Hideo Fujiwara:
Testing for the programming circuit of LUT-based FPGAs.
Asian Test Symposium 1997: 242-247 |
| 1996 |
|---|
| 2 | EE | Hiroyuki Michinishi,
Tokumi Yokohira,
Takuji Okamoto,
Tomoo Inoue,
Hideo Fujiwara:
A Test Methodology for Interconnect Structures of LUT-based FPGAs.
Asian Test Symposium 1996: 68-74 |
| 1995 |
|---|
| 1 | EE | Tomoo Inoue,
Hideo Fujiwara,
Hiroyuki Michinishi,
Tokumi Yokohira,
Takuji Okamoto:
Universal test complexity of field-programmable gate arrays.
Asian Test Symposium 1995: 259-265 |
