Tokumi Yokohira

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15EETutomu Murase, Hiroki Fujiwara, Yukinobu Fukushima, Masayoshi Kobayashi, Tokumi Yokohira: Performance Evaluation of a Multi-Stage Network Event Detection Scheme for Decreasing the False-Positive Rate for a Large Number of Simultaneous, Unknown Events. ICN 2007: 97
14EEHui Wang, Shigeyuki Osada, Tokumi Yokohira, Kiyohiko Okayama, Nariyoshi Yamai: Effect of Premature ACK Transmission Timing on Throughput in TCP with a Performance Enhancing Proxy. IEICE Transactions 90-B(1): 31-41 (2007)
13EEHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo: Detection of CMOS Open Node Defects by Frequency Analysis. IEICE Transactions 90-D(3): 685-687 (2007)
12EEMasataka Yonezu, Nobuo Funabiki, Tomoya Kitani, Tokumi Yokohira, Toru Nakanishi, Teruo Higashino: Proposal of a hierarchical heuristic algorithm for node assignment in bidirectional Manhattan street networks. Systems and Computers in Japan 38(4): 74-83 (2007)
11EETokumi Yokohira, Kiyohiko Okayama: High-Speed Calculation of Worst-Case Link Delays in the EDD Connection Admission Control Scheme. IEICE Transactions 89-B(7): 2012-2022 (2006)
10EETokumi Yokohira, Kiyohiko Okayama: Node Placement Algorithms in the Case that Routes are Design Variables in Shuffle-Like Multihop Lightwave Networks. IEICE Transactions 88-B(12): 4578-4587 (2005)
9EEHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo: Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test. Asian Test Symposium 2003: 406-411
8EEHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo: CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power Supply. Asian Test Symposium 2002: 417-422
7EEShigeto Tajima, Masakazu Fujii, Nobuo Funabiki, Tokumi Yokohira, Kazufumi Tsunemura, Teruo Higashino: An Optimal Path Selection Algorithm for Static and Mobile Multicast Routing Problems. ICOIN (1) 2002: 193-202
6EENobuo Funabiki, Toru Nakanishi, Tokumi Yokohira, Shigeto Tajima, Teruo Higashino: A Proposal of a Quasi-Solution State Evolution Algorithm for Channel Assignment Problems. ICOIN (2) 2002: 32-41
5EEHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara: Testing for the programming circuit of LUT-based FPGAs. Asian Test Symposium 1997: 242-247
4EEHiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Tomoo Inoue, Hideo Fujiwara: A Test Methodology for Interconnect Structures of LUT-based FPGAs. Asian Test Symposium 1996: 68-74
3EETomoo Inoue, Hideo Fujiwara, Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto: Universal test complexity of field-programmable gate arrays. Asian Test Symposium 1995: 259-265
2 Hiroshi Inai, Takeshi Nishida, Tokumi Yokohira, Hideo Miyahara: End-to-End Performance Modeling for Layered Communication Protocol. INFOCOM 1990: 442-449
1 Tokumi Yokohira, Takeshi Nishida, Hideo Miyahara: Analysis of Dynamic Behavior in p-Persistent CSMA/CD Using Cusp Catastrophe. Computer Networks 12: 277-289 (1986)

Coauthor Index

1Masakazu Fujii [7]
2Hideo Fujiwara [3] [4] [5]
3Hiroki Fujiwara [15]
4Yukinobu Fukushima [15]
5Nobuo Funabiki [6] [7] [12]
6Teruo Higashino [6] [7] [12]
7Tsutomu Hondo [8] [9] [13]
8Hiroshi Inai [2]
9Tomoo Inoue [3] [4] [5]
10Tomoya Kitani [12]
11Masayoshi Kobayashi [15]
12Toshifumi Kobayashi [8] [9] [13]
13Hiroyuki Michinishi [3] [4] [5] [8] [9] [13]
14Hideo Miyahara [1] [2]
15Tutomu Murase [15]
16Toru Nakanishi [6] [12]
17Takeshi Nishida [1] [2]
18Takuji Okamoto [3] [4] [5] [8] [9] [13]
19Kiyohiko Okayama [10] [11] [14]
20Shigeyuki Osada [14]
21Shigeto Tajima [6] [7]
22Kazufumi Tsunemura [7]
23Hui Wang [14]
24Nariyoshi Yamai [14]
25Masataka Yonezu [12]

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Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)