| |
| 2002 | ||
|---|---|---|
| 1 | EE | R. Rodríguez, James H. Stathis, Barry P. Linder, S. Kowalczyk, Ching-Te Chuang, Rajiv V. Joshi, Gregory A. Northrop, Kerry Bernstein, A. J. Bhavnagarwala, Salvatore Lombardo: Analysis of the effect of the gate oxide breakdown on SRAM stability. Microelectronics Reliability 42(9-11): 1445-1448 (2002) |
| 1 | Kerry Bernstein | [1] |
| 2 | Ching-Te Chuang | [1] |
| 3 | Rajiv V. Joshi | [1] |
| 4 | S. Kowalczyk | [1] |
| 5 | Barry P. Linder | [1] |
| 6 | Salvatore Lombardo | [1] |
| 7 | Gregory A. Northrop | [1] |
| 8 | R. Rodríguez | [1] |
| 9 | James H. Stathis | [1] |