| |
| 2006 | ||
|---|---|---|
| 1 | EE | Kerry Bernstein, David J. Frank, Anne E. Gattiker, Wilfried Haensch, Brian L. Ji, Sani R. Nassif, Edward J. Nowak, Dale J. Pearson, Norman J. Rohrer: High-performance CMOS variability in the 65-nm regime and beyond. IBM Journal of Research and Development 50(4-5): 433-450 (2006) |
| 1 | Kerry Bernstein | [1] |
| 2 | David J. Frank | [1] |
| 3 | Anne E. Gattiker | [1] |
| 4 | Wilfried Haensch | [1] |
| 5 | Sani R. Nassif | [1] |
| 6 | Edward J. Nowak | [1] |
| 7 | Dale J. Pearson | [1] |
| 8 | Norman J. Rohrer | [1] |