2008 |
10 | EE | Georges G. E. Gielen,
P. De Wit,
E. Maricau,
J. Loeckx,
J. Martin-Martinez,
Ben Kaczer,
Guido Groeseneken,
R. Rodríguez,
M. Nafría:
Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies.
DATE 2008: 1322-1327 |
2006 |
9 | EE | Eva M. Ortigosa,
Antonio Cañas,
R. Rodríguez,
Javier Díaz,
Sonia Mota:
Towards an Optimal Implementation of MLP in FPGA.
ARC 2006: 46-51 |
8 | EE | R. Fernández,
R. Rodríguez,
M. Nafría,
X. Aymerich,
Ben Kaczer,
Guido Groeseneken:
FinFET and MOSFET preliminary comparison of gate oxide reliability.
Microelectronics Reliability 46(9-11): 1608-1611 (2006) |
2005 |
7 | EE | R. Fernández,
R. Rodríguez,
M. Nafría,
X. Aymerich:
Influence of oxide breakdown position and device aspect ratio on MOSFET's output characteristics.
Microelectronics Reliability 45(5-6): 861-864 (2005) |
2003 |
6 | EE | James H. Stathis,
R. Rodríguez,
Barry P. Linder:
Circuit implications of gate oxide breakdown.
Microelectronics Reliability 43(8): 1193-1197 (2003) |
5 | EE | James H. Stathis,
Barry P. Linder,
R. Rodríguez,
Salvatore Lombardo:
Reliability of ultra-thin oxides in CMOS circuits.
Microelectronics Reliability 43(9-11): 1353-1360 (2003) |
4 | EE | R. Rodríguez,
James H. Stathis,
Barry P. Linder,
Rajiv V. Joshi,
Ching-Te Chuang:
Influence and model of gate oxide breakdown on CMOS inverters.
Microelectronics Reliability 43(9-11): 1439-1444 (2003) |
2002 |
3 | EE | R. Rodríguez,
James H. Stathis,
Barry P. Linder,
S. Kowalczyk,
Ching-Te Chuang,
Rajiv V. Joshi,
Gregory A. Northrop,
Kerry Bernstein,
A. J. Bhavnagarwala,
Salvatore Lombardo:
Analysis of the effect of the gate oxide breakdown on SRAM stability.
Microelectronics Reliability 42(9-11): 1445-1448 (2002) |
2001 |
2 | EE | R. Rodríguez,
M. Porti,
M. Nafría,
X. Aymerich:
Influence of a low field with opposite polarity to the stress on the degradation of 4.5 nm thick SiO2 films.
Microelectronics Reliability 41(7): 1011-1013 (2001) |
1999 |
1 | | R. G. Durán,
L. Hervella-Nieto,
E. Liberman,
R. Rodríguez,
J. Solomin:
Approximation of the vibration modes of a plate by Reissner-Mindlin equations.
Math. Comput. 68(228): 1447-1463 (1999) |