ITC 1982:
Philadelphia,
PA,
USA
Proceedings International Test Conference 1982, Philadelphia, PA, USA, November 1982.
IEEE Computer Society 1982 BibTeX
@proceedings{DBLP:conf/itc/1982,
title = {Proceedings International Test Conference 1982, Philadelphia,
PA, USA, November 1982},
booktitle = {ITC},
publisher = {IEEE Computer Society},
year = {1982},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Session 1:
Invited Speekers
Session 2:
Fault Modeling and Test Effectiveness Evaluation for VLSI Circuits
Session 3:
Design for Testability
Session 4:
Test Equipment and Methods I
Panel Session 7:
Professional Aspects of Test Engineering
Session 8:
ATPG and Simulation Systems-The State of the Art.
Session 9:
Self-Test:
Chip Level to System Level Approaches
Session 10:
Memory-Test-An International Art
Session 11:
Quality and Reliability
Session 12:
Test Data Analysis Closes the Production Loop
Session 13:
Testability Measurement and Enhancement
Session 14:
Systems Tools
Session 15:
Computer Enhanced Analog Test Techniques
- David C. Cheng:
A Precision Measurement Technique for High Frequency Repetitive Signals.
428-434 BibTeX
- K. Uchida:
Testing the Dynamic Performance of High-Speed A/D Converters.
435-440 BibTeX
- Stephen W. Bryson:
Testing an Audio Spectrum Analyzer for Speech Recognition Systems.
441-446 BibTeX
- Tim Higgins:
Digital Signal Processing for Production Testing of Analog LSI Devices.
447-457 BibTeX
Session 16:
VLSI/MicroprocessorTests-Making Micrprocessors More Testable
Session 17:
Test Software
Session 18:
Board Testing I
- Reymon Oberly:
Board Testing.
528 BibTeX
- Eric H. Millham:
Board Test Session I.
529 BibTeX
- Matthew L. Fichtenbaum:
Faults Which Challenge the In-Circuit Tester: Some Examples and Some Solutions.
530-536 BibTeX
- T. Jackson, P. Vais, K. Schwerbrock:
A New Approach to On-Board Microprocessor-Based Self-Test.
537-540 BibTeX
- Herold Levine, Charles Berking, Alan Blair, Kenneth R. Bowden, Peter deBruyn Kops, David Giles, David Ruhoff, Kenneth Wacks:
Design of a New Test Generation System for Performance Testing of LSI Digital Printed Circuit Boards.
541-547 BibTeX
- Dennis Hebert, Jack H. Arabian:
Implications of the Technique for Dynamic High Speed Functional Testing.
548-557 BibTeX
Session 19:
Test Economics
Session 20:
VLSI/Microprocessor Tests-New Approaches
Session 21:
Test Equipment and Methods II
Session 22:
Board Testing II
Copyright © Sat May 16 23:26:39 2009
by Michael Ley (ley@uni-trier.de)
