Richard M. Sedmak

2001
6		William Eklow, Richard M. Sedmak, Dan Singletary, Toai Vo: Unsafe board states during PC-based boundary-scan testing. ITC 2001: 615-623
1996
5	EE	Richard M. Sedmak, John S. Evans: Spanning the Product Life Cycle: RASSP DFT. IEEE Design & Test of Computers 13(3): 32-42 (1996)
1995
4		Richard M. Sedmak, John Evans: A Hierarchical, Desgin-for-Testability (DFT) Methodology for the Rapid Prototyping of Application-Specific Signal Processors (RASSP). ITC 1995: 319-327
1986
3		Richard M. Sedmak: On the Possible Limits of External Testing. ITC 1986: 8
1982
2		Richard M. Sedmak: Self-Test Chip to System Level Approaches. ITC 1982: 182
1980
1		Richard M. Sedmak, Harris L. Liebergot: Fault Tolerance of a General Purpose Computer Implemented by Very Large Scale Integration. IEEE Trans. Computers 29(6): 492-500 (1980)

Coauthor Index

1	Bill Eklow (William Eklow)	[6]
2	John Evans	[4]
3	John S. Evans	[5]
4	Harris L. Liebergot	[1]
5	Dan Singletary	[6]
6	Toai Vo	[6]

Colors in the list of coauthors