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K. H. Arya

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1982
1 C. C. Beh, K. H. Arya, Charles E. Radke, E. Kofi Vida-Torku: Do Stuck Fault Models Reflect Manufacturing Defects? ITC 1982: 35-42

Coauthor Index

1C. C. Beh [1]
2Charles E. Radke [1]
3E. Kofi Vida-Torku [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)