K. H. Arya
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1982
1
C. C. Beh
, K. H. Arya,
Charles E. Radke
,
E. Kofi Vida-Torku
: Do Stuck Fault Models Reflect Manufacturing Defects?
ITC 1982
: 35-42
Coauthor
Index
1
C. C. Beh
[
1
]
2
Charles E. Radke
[
1
]
3
E. Kofi Vida-Torku
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
