1997 |
3 | EE | Magdy S. Abadir,
Jacob A. Abraham,
H. Hao,
C. Hunter,
Wayne M. Needham,
Ron G. Walther:
Microprocessor Test and Validation: Any New Avenues?
VTS 1997: 458-464 |
1994 |
2 | EE | Jacob A. Abraham,
Sandip Kundu,
Janak H. Patel,
Manuel A. d'Abreu,
Bulent I. Dervisoglu,
Marc E. Levitt,
Hector R. Sucar,
Ron G. Walther:
Microprocessor Testing: Which Technique is Best? (Panel).
DAC 1994: 294 |
1982 |
1 | | Sumit DasGupta,
Prabhakar Goel,
Ron G. Walther,
Tom W. Williams:
A Variation of LSSD and Its Implications on Design and Test Pattern Generation in VLSI.
ITC 1982: 63-66 |