1983 | ||
---|---|---|
2 | Y. Kuramitsu, Y. Gamo: A Suitable Test System for Gate Array. ITC 1983: 21-24 | |
1982 | ||
1 | T. Tada, T. Kobayashi, K. Okada, Y. Kuramitsu: Testing of Sense Amplifier in Dynamic Memory. ITC 1982: 245-251 |
1 | Y. Gamo | [2] |
2 | T. Kobayashi | [1] |
3 | K. Okada | [1] |
4 | T. Tada | [1] |