| 1983 |
|---|
| 4 | | Shigeru Sugamori,
Kunio Takeuchi,
Hiromi Maruyama,
Shinpei Kamata:
High-Fidelity Device Tester Interface.
ITC 1983: 371-378 |
| 3 | | Masaaki Arao,
Takao Tadokoro,
Hiromi Maruyama,
Shinpei Kamata:
Tester Correlation Problem in Memory Testers Used in Production Lines.
ITC 1983: 464-470 |
| 1982 |
|---|
| 2 | | Junji Nishiura,
Toshio Maruyama,
Hiromi Maruyama,
Shinpei Kamata:
Testing VLSI Microprocessor with New Functional Capability.
ITC 1982: 628-633 |
| 1981 |
|---|
| 1 | | Shigeru Sugamori,
Kenji Yoshida,
Hiromi Maruyama,
Shinpei Kamata,
Tsuneta Sudo:
Analysis and Definition of Overall Timing Accuracy in VLSI Test System.
ITC 1981: 143-153 |
