S. Cohen

2006
3	EE	J. R. Lloyd, C. E. Murray, S. Ponoth, S. Cohen, E. Liniger: The effect of Cu diffusion on the TDDB behavior in a low-k interlevel dielectrics. Microelectronics Reliability 46(9-11): 1643-1647 (2006)
1997
2		Tora K. Bikson, J. D. Eveland, S. Cohen, D. Mankin: Knowledge-Based Teams: Technology, Reinvention and Critical Process Redesign. HCI (1) 1997: 205-208
1982
1		K. Thangamuthu, M. Macari, S. Cohen: Automated Contactless Digital Test System for VLSI. ITC 1982: 634-639

Coauthor Index

1	Tora K. Bikson	[2]
2	J. D. Eveland	[2]
3	E. Liniger	[3]
4	J. R. Lloyd	[3]
5	M. Macari	[1]
6	D. Mankin	[2]
7	C. E. Murray	[3]
8	S. Ponoth	[3]
9	K. Thangamuthu	[1]

Colors in the list of coauthors