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D. B. Boyle

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1982
1 I. M. Watson, John A. Newkirk, Robert G. Mathews, D. B. Boyle: ICTEST : A Unified System for Functional Testing and Simulation of Digital ICs. ITC 1982: 499-502

Coauthor Index

1Robert G. Mathews [1]
2John A. Newkirk [1]
3I. M. Watson [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)