| |
| 1982 | ||
|---|---|---|
| 3 | Chi-Chang Liaw, Stephen Y. H. Su: A New Fault Model and Testing Technique for CMOS Devices. ITC 1982: 25-34 | |
| 1981 | ||
| 2 | Chi-Chang Liaw, Stephen Y. H. Su, Yashwant K. Malaiya: State Diagram Approach for Functional Testing of Control Section. ITC 1981: 433-446 | |
| 1 | Chi-Chang Liaw, Stephen Y. H. Su, Yashwant K. Malaiya: Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits. IEEE Trans. Computers 30(12): 989-995 (1981) | |
| 1 | Yashwant K. Malaiya | [1] [2] |
| 2 | Stephen Y. H. Su | [1] [2] [3] |