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E. Kofi Vida-Torku

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1998
5EEE. Kofi Vida-Torku, George Joos: Designing for scan test of high performance embedded memories. ITC 1998: 101-
1994
4 Craig Hunter, E. Kofi Vida-Torku, Johnny LeBlanc: Balancing Structured and Ad-hoc Design for Test: Testing of the PowerPC 603TM Microprocessor. ITC 1994: 76-83
1992
3 E. Kofi Vida-Torku: Impact of Boundary Scan Design on Delay Test. ITC 1992: 96-105
1986
2 E. Kofi Vida-Torku, James A. Monzel, Charles E. Radke: Performance Assurance of Memories Embedded in VLSI Chips. ITC 1986: 154-160
1982
1 C. C. Beh, K. H. Arya, Charles E. Radke, E. Kofi Vida-Torku: Do Stuck Fault Models Reflect Manufacturing Defects? ITC 1982: 35-42

Coauthor Index

1K. H. Arya [1]
2C. C. Beh [1]
3Craig Hunter [4]
4George Joos [5]
5Johnny LeBlanc [4]
6James A. Monzel [2]
7Charles E. Radke [1] [2]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)