E. Kofi Vida-Torku

1998
5	EE	E. Kofi Vida-Torku, George Joos: Designing for scan test of high performance embedded memories. ITC 1998: 101-
1994
4		Craig Hunter, E. Kofi Vida-Torku, Johnny LeBlanc: Balancing Structured and Ad-hoc Design for Test: Testing of the PowerPC 603TM Microprocessor. ITC 1994: 76-83
1992
3		E. Kofi Vida-Torku: Impact of Boundary Scan Design on Delay Test. ITC 1992: 96-105
1986
2		E. Kofi Vida-Torku, James A. Monzel, Charles E. Radke: Performance Assurance of Memories Embedded in VLSI Chips. ITC 1986: 154-160
1982
1		C. C. Beh, K. H. Arya, Charles E. Radke, E. Kofi Vida-Torku: Do Stuck Fault Models Reflect Manufacturing Defects? ITC 1982: 35-42

Coauthor Index

1	K. H. Arya	[1]
2	C. C. Beh	[1]
3	Craig Hunter	[4]
4	George Joos	[5]
5	Johnny LeBlanc	[4]
6	James A. Monzel	[2]
7	Charles E. Radke	[1] [2]

Colors in the list of coauthors