| |
| 1982 | ||
|---|---|---|
| 1 | Herold Levine, Charles Berking, Alan Blair, Kenneth R. Bowden, Peter deBruyn Kops, David Giles, David Ruhoff, Kenneth Wacks: Design of a New Test Generation System for Performance Testing of LSI Digital Printed Circuit Boards. ITC 1982: 541-547 | |
| 1 | Charles Berking | [1] |
| 2 | Alan Blair | [1] |
| 3 | Kenneth R. Bowden | [1] |
| 4 | David Giles | [1] |
| 5 | Herold Levine | [1] |
| 6 | David Ruhoff | [1] |
| 7 | Kenneth Wacks | [1] |