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Peter deBruyn Kops

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1982
1 Herold Levine, Charles Berking, Alan Blair, Kenneth R. Bowden, Peter deBruyn Kops, David Giles, David Ruhoff, Kenneth Wacks: Design of a New Test Generation System for Performance Testing of LSI Digital Printed Circuit Boards. ITC 1982: 541-547

Coauthor Index

1Charles Berking [1]
2Alan Blair [1]
3Kenneth R. Bowden [1]
4David Giles [1]
5Herold Levine [1]
6David Ruhoff [1]
7Kenneth Wacks [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)