2007 | ||
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18 | EE | Reimund Wittmann, Massimo Vanzi, Hans-Joachim Wassener, Navraj Nandra, Joachim Kunkel, Jose Franca, Christian Münker: Life begins at 65: unless you are mixed signal? DATE 2007: 936-941 |
2006 | ||
17 | EE | M. Meneghini, Simona Podda, A. Morelli, Ruggero Pintus, L. Trevisanello, Gaudenzio Meneghesso, Massimo Vanzi, Enrico Zanoni: High brightness GaN LEDs degradation during dc and pulsed stress. Microelectronics Reliability 46(9-11): 1720-1724 (2006) |
16 | EE | G. Cassanelli, G. Mura, Fausto Fantini, Massimo Vanzi, B. Plano: Failure Analysis-assisted FMEA. Microelectronics Reliability 46(9-11): 1795-1799 (2006) |
2005 | ||
15 | EE | Francesca Mighela, Cristian Perra, Massimo Vanzi: Video Streaming in Electron Microscopy Applications. VLBV 2005: 115-120 |
14 | EE | G. Cassanelli, G. Mura, F. Cesaretti, Massimo Vanzi, Fausto Fantini: Reliability predictions in electronic industrial applications. Microelectronics Reliability 45(9-11): 1321-1326 (2005) |
13 | EE | Ruggero Pintus, Simona Podda, Massimo Vanzi: Image alignment for 3D reconstruction in a SEM. Microelectronics Reliability 45(9-11): 1581-1584 (2005) |
2003 | ||
12 | EE | Gaudenzio Meneghesso, S. Levada, Enrico Zanoni, G. Scamarcio, G. Mura, Simona Podda, Massimo Vanzi, S. Du, I. Eliashevich: Reliability of visible GaN LEDs in plastic package. Microelectronics Reliability 43(9-11): 1737-1742 (2003) |
11 | EE | G. Mura, Massimo Vanzi, Maria Stangoni, Mauro Ciappa, Wolfgang Fichtner: On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices. Microelectronics Reliability 43(9-11): 1771-1776 (2003) |
2002 | ||
10 | EE | Fausto Fantini, Massimo Vanzi: Editorial. Microelectronics Reliability 42(9-11): 1249 (2002) |
9 | EE | Gaudenzio Meneghesso, A. Cocco, G. Mura, Simona Podda, Massimo Vanzi: Backside Failure Analysis of GaAs ICs after ESD tests. Microelectronics Reliability 42(9-11): 1293-1298 (2002) |
8 | EE | L. Sponton, L. Cerati, G. Croce, G. Mura, Simona Podda, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni: ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology. Microelectronics Reliability 42(9-11): 1303-1306 (2002) |
7 | EE | M. Giglio, G. Martines, G. Mura, Simona Podda, Massimo Vanzi: An automated lifetest equipment for optical emitters. Microelectronics Reliability 42(9-11): 1311-1315 (2002) |
6 | EE | Massimo Vanzi, G. Salmini, R. Pastorelli, S. Pessina, P. Furcas: Reliability tests on WDM filters. Microelectronics Reliability 42(9-11): 1317-1321 (2002) |
5 | EE | C. Caprile, I. De Munari, M. Improntac, Simona Podda, A. Scorzoni, Massimo Vanzi: A specimen-current branching approach for FA of long Electromigration test lines. Microelectronics Reliability 42(9-11): 1715-1718 (2002) |
2001 | ||
4 | EE | Daniel L. Barton, Shigeru Nakajima, Massimo Vanzi: Editorial. Microelectronics Reliability 41(8): 1143-1144 (2001) |
1988 | ||
3 | EE | Claudio Lombardi, Stefano Manzini, Antonio Saporito, Massimo Vanzi: A physically based mobility model for numerical simulation of nonplanar devices. IEEE Trans. on CAD of Integrated Circuits and Systems 7(11): 1164-1171 (1988) |
1987 | ||
2 | EE | Zhiping Yu, Robert W. Dutton, Massimo Vanzi: An Extension to Newton's Method in Device Simulators--On An Efficient Algorithm to Evaluate Small-Signal Parameters and to Predict Initial Guess. IEEE Trans. on CAD of Integrated Circuits and Systems 6(1): 41-45 (1987) |
1986 | ||
1 | EE | Claudio Turchetti, P. Prioretti, Guido Masetti, E. Profumo, Massimo Vanzi: A Meyer-Like Approach for the Transient Analysis of Digital MOS IC's. IEEE Trans. on CAD of Integrated Circuits and Systems 5(4): 499-507 (1986) |