2007 |
18 | EE | Reimund Wittmann,
Massimo Vanzi,
Hans-Joachim Wassener,
Navraj Nandra,
Joachim Kunkel,
Jose Franca,
Christian Münker:
Life begins at 65: unless you are mixed signal?
DATE 2007: 936-941 |
2006 |
17 | EE | M. Meneghini,
Simona Podda,
A. Morelli,
Ruggero Pintus,
L. Trevisanello,
Gaudenzio Meneghesso,
Massimo Vanzi,
Enrico Zanoni:
High brightness GaN LEDs degradation during dc and pulsed stress.
Microelectronics Reliability 46(9-11): 1720-1724 (2006) |
16 | EE | G. Cassanelli,
G. Mura,
Fausto Fantini,
Massimo Vanzi,
B. Plano:
Failure Analysis-assisted FMEA.
Microelectronics Reliability 46(9-11): 1795-1799 (2006) |
2005 |
15 | EE | Francesca Mighela,
Cristian Perra,
Massimo Vanzi:
Video Streaming in Electron Microscopy Applications.
VLBV 2005: 115-120 |
14 | EE | G. Cassanelli,
G. Mura,
F. Cesaretti,
Massimo Vanzi,
Fausto Fantini:
Reliability predictions in electronic industrial applications.
Microelectronics Reliability 45(9-11): 1321-1326 (2005) |
13 | EE | Ruggero Pintus,
Simona Podda,
Massimo Vanzi:
Image alignment for 3D reconstruction in a SEM.
Microelectronics Reliability 45(9-11): 1581-1584 (2005) |
2003 |
12 | EE | Gaudenzio Meneghesso,
S. Levada,
Enrico Zanoni,
G. Scamarcio,
G. Mura,
Simona Podda,
Massimo Vanzi,
S. Du,
I. Eliashevich:
Reliability of visible GaN LEDs in plastic package.
Microelectronics Reliability 43(9-11): 1737-1742 (2003) |
11 | EE | G. Mura,
Massimo Vanzi,
Maria Stangoni,
Mauro Ciappa,
Wolfgang Fichtner:
On the behaviour of the selective iodine-based gold etch for the failure analysis of aged optoelectronic devices.
Microelectronics Reliability 43(9-11): 1771-1776 (2003) |
2002 |
10 | EE | Fausto Fantini,
Massimo Vanzi:
Editorial.
Microelectronics Reliability 42(9-11): 1249 (2002) |
9 | EE | Gaudenzio Meneghesso,
A. Cocco,
G. Mura,
Simona Podda,
Massimo Vanzi:
Backside Failure Analysis of GaAs ICs after ESD tests.
Microelectronics Reliability 42(9-11): 1293-1298 (2002) |
8 | EE | L. Sponton,
L. Cerati,
G. Croce,
G. Mura,
Simona Podda,
Massimo Vanzi,
Gaudenzio Meneghesso,
Enrico Zanoni:
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology.
Microelectronics Reliability 42(9-11): 1303-1306 (2002) |
7 | EE | M. Giglio,
G. Martines,
G. Mura,
Simona Podda,
Massimo Vanzi:
An automated lifetest equipment for optical emitters.
Microelectronics Reliability 42(9-11): 1311-1315 (2002) |
6 | EE | Massimo Vanzi,
G. Salmini,
R. Pastorelli,
S. Pessina,
P. Furcas:
Reliability tests on WDM filters.
Microelectronics Reliability 42(9-11): 1317-1321 (2002) |
5 | EE | C. Caprile,
I. De Munari,
M. Improntac,
Simona Podda,
A. Scorzoni,
Massimo Vanzi:
A specimen-current branching approach for FA of long Electromigration test lines.
Microelectronics Reliability 42(9-11): 1715-1718 (2002) |
2001 |
4 | EE | Daniel L. Barton,
Shigeru Nakajima,
Massimo Vanzi:
Editorial.
Microelectronics Reliability 41(8): 1143-1144 (2001) |
1988 |
3 | EE | Claudio Lombardi,
Stefano Manzini,
Antonio Saporito,
Massimo Vanzi:
A physically based mobility model for numerical simulation of nonplanar devices.
IEEE Trans. on CAD of Integrated Circuits and Systems 7(11): 1164-1171 (1988) |
1987 |
2 | EE | Zhiping Yu,
Robert W. Dutton,
Massimo Vanzi:
An Extension to Newton's Method in Device Simulators--On An Efficient Algorithm to Evaluate Small-Signal Parameters and to Predict Initial Guess.
IEEE Trans. on CAD of Integrated Circuits and Systems 6(1): 41-45 (1987) |
1986 |
1 | EE | Claudio Turchetti,
P. Prioretti,
Guido Masetti,
E. Profumo,
Massimo Vanzi:
A Meyer-Like Approach for the Transient Analysis of Digital MOS IC's.
IEEE Trans. on CAD of Integrated Circuits and Systems 5(4): 499-507 (1986) |