| |
| 2002 | ||
|---|---|---|
| 1 | EE | C. Caprile, I. De Munari, M. Improntac, Simona Podda, A. Scorzoni, Massimo Vanzi: A specimen-current branching approach for FA of long Electromigration test lines. Microelectronics Reliability 42(9-11): 1715-1718 (2002) |
| 1 | C. Caprile | [1] |
| 2 | I. De Munari | [1] |
| 3 | Simona Podda | [1] |
| 4 | A. Scorzoni | [1] |
| 5 | Massimo Vanzi | [1] |