| |
| 2002 | ||
|---|---|---|
| 1 | EE | Gaudenzio Meneghesso, A. Cocco, G. Mura, Simona Podda, Massimo Vanzi: Backside Failure Analysis of GaAs ICs after ESD tests. Microelectronics Reliability 42(9-11): 1293-1298 (2002) |
| 1 | Gaudenzio Meneghesso | [1] |
| 2 | G. Mura | [1] |
| 3 | Simona Podda | [1] |
| 4 | Massimo Vanzi | [1] |