| |
| 2006 | ||
|---|---|---|
| 2 | EE | M. Meneghini, Simona Podda, A. Morelli, Ruggero Pintus, L. Trevisanello, Gaudenzio Meneghesso, Massimo Vanzi, Enrico Zanoni: High brightness GaN LEDs degradation during dc and pulsed stress. Microelectronics Reliability 46(9-11): 1720-1724 (2006) |
| 2005 | ||
| 1 | EE | Ruggero Pintus, Simona Podda, Massimo Vanzi: Image alignment for 3D reconstruction in a SEM. Microelectronics Reliability 45(9-11): 1581-1584 (2005) |
| 1 | Gaudenzio Meneghesso | [2] |
| 2 | M. Meneghini | [2] |
| 3 | A. Morelli | [2] |
| 4 | Simona Podda | [1] [2] |
| 5 | L. Trevisanello | [2] |
| 6 | Massimo Vanzi | [1] [2] |
| 7 | Enrico Zanoni | [2] |