| 2006 |
|---|
| 7 | EE | M. Meneghini,
Simona Podda,
A. Morelli,
Ruggero Pintus,
L. Trevisanello,
Gaudenzio Meneghesso,
Massimo Vanzi,
Enrico Zanoni:
High brightness GaN LEDs degradation during dc and pulsed stress.
Microelectronics Reliability 46(9-11): 1720-1724 (2006) |
| 2005 |
|---|
| 6 | EE | Ruggero Pintus,
Simona Podda,
Massimo Vanzi:
Image alignment for 3D reconstruction in a SEM.
Microelectronics Reliability 45(9-11): 1581-1584 (2005) |
| 2003 |
|---|
| 5 | EE | Gaudenzio Meneghesso,
S. Levada,
Enrico Zanoni,
G. Scamarcio,
G. Mura,
Simona Podda,
Massimo Vanzi,
S. Du,
I. Eliashevich:
Reliability of visible GaN LEDs in plastic package.
Microelectronics Reliability 43(9-11): 1737-1742 (2003) |
| 2002 |
|---|
| 4 | EE | Gaudenzio Meneghesso,
A. Cocco,
G. Mura,
Simona Podda,
Massimo Vanzi:
Backside Failure Analysis of GaAs ICs after ESD tests.
Microelectronics Reliability 42(9-11): 1293-1298 (2002) |
| 3 | EE | L. Sponton,
L. Cerati,
G. Croce,
G. Mura,
Simona Podda,
Massimo Vanzi,
Gaudenzio Meneghesso,
Enrico Zanoni:
ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology.
Microelectronics Reliability 42(9-11): 1303-1306 (2002) |
| 2 | EE | M. Giglio,
G. Martines,
G. Mura,
Simona Podda,
Massimo Vanzi:
An automated lifetest equipment for optical emitters.
Microelectronics Reliability 42(9-11): 1311-1315 (2002) |
| 1 | EE | C. Caprile,
I. De Munari,
M. Improntac,
Simona Podda,
A. Scorzoni,
Massimo Vanzi:
A specimen-current branching approach for FA of long Electromigration test lines.
Microelectronics Reliability 42(9-11): 1715-1718 (2002) |
