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Enrico Zanoni

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2006
10EEM. Meneghini, Simona Podda, A. Morelli, Ruggero Pintus, L. Trevisanello, Gaudenzio Meneghesso, Massimo Vanzi, Enrico Zanoni: High brightness GaN LEDs degradation during dc and pulsed stress. Microelectronics Reliability 46(9-11): 1720-1724 (2006)
9EEFrancesca Danesin, F. Zanon, Simone Gerardin, F. Rampazzo, Gaudenzio Meneghesso, Enrico Zanoni, Alessandro Paccagnella: Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors. Microelectronics Reliability 46(9-11): 1750-1753 (2006)
2005
8EEG. Verzellesi, Gaudenzio Meneghesso, A. Chini, Enrico Zanoni, C. Canali: DC-to-RF dispersion effects in GaAs- and GaN-based heterostructure FETs: performance and reliability issues. Microelectronics Reliability 45(9-11): 1585-1592 (2005)
7EEA. Tazzoli, Gaudenzio Meneghesso, Enrico Zanoni: A novel fast and versatile temperature measurement system for LDMOS transistors. Microelectronics Reliability 45(9-11): 1742-1745 (2005)
2003
6EEGaudenzio Meneghesso, N. Novembre, Enrico Zanoni, L. Sponton, L. Cerati, G. Croce: Optimization of ESD protection structures suitable for BCD6 smart power technology. Microelectronics Reliability 43(9-11): 1589-1594 (2003)
5EEGaudenzio Meneghesso, S. Levada, Enrico Zanoni, G. Scamarcio, G. Mura, Simona Podda, Massimo Vanzi, S. Du, I. Eliashevich: Reliability of visible GaN LEDs in plastic package. Microelectronics Reliability 43(9-11): 1737-1742 (2003)
2002
4EEGaudenzio Meneghesso, Enrico Zanoni: Failure modes and mechanisms of InP-based and metamorphic high electron mobility transistors. Microelectronics Reliability 42(4-5): 685-708 (2002)
3EEL. Sponton, L. Cerati, G. Croce, G. Mura, Simona Podda, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni: ESD protection structures for 20 V and 40 V power supply suitable for BCD6 smart power technology. Microelectronics Reliability 42(9-11): 1303-1306 (2002)
2001
2EEStefano Zanella, Andrea Neviani, Enrico Zanoni, Paolo Miliozzi, Edoardo Charbon, Carlo Guardiani, Luca P. Carloni, Alberto L. Sangiovanni-Vincentelli: Modeling of Substrate Noise Injected by Digital Libraries. ISQED 2001: 488-
1 Gaudenzio Meneghesso, Gaudenzio Chini, Enrico Zanoni: Long Term Stability of InGaAs/AlInAs/GaAs Methamorphic HEMTs. Microelectronics Reliability 41(9-10): 1579-1584 (2001)

Coauthor Index

1C. Canali [8]
2Luca P. Carloni [2]
3L. Cerati [3] [6]
4Edoardo Charbon [2]
5A. Chini [8]
6Gaudenzio Chini [1]
7G. Croce [3] [6]
8Francesca Danesin [9]
9S. Du [5]
10I. Eliashevich [5]
11Simone Gerardin [9]
12Carlo Guardiani [2]
13S. Levada [5]
14Gaudenzio Meneghesso [1] [3] [4] [5] [6] [7] [8] [9] [10]
15M. Meneghini [10]
16Paolo Miliozzi [2]
17A. Morelli [10]
18G. Mura [3] [5]
19Andrea Neviani [2]
20N. Novembre [6]
21Alessandro Paccagnella [9]
22Ruggero Pintus [10]
23Simona Podda [3] [5] [10]
24F. Rampazzo [9]
25Alberto L. Sangiovanni-Vincentelli [2]
26G. Scamarcio [5]
27L. Sponton [3] [6]
28A. Tazzoli [7]
29L. Trevisanello [10]
30Massimo Vanzi [3] [5] [10]
31G. Verzellesi [8]
32Stefano Zanella [2]
33F. Zanon [9]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)