| |
| 2001 | ||
|---|---|---|
| 3 | EE | Daniel L. Barton, Shigeru Nakajima, Massimo Vanzi: Editorial. Microelectronics Reliability 41(8): 1143-1144 (2001) |
| 2 | EE | Hide Murayama, Makoto Yamazaki, Shigeru Nakajima: Electromigration and electrochemical reaction mixed failure mechanism in gold interconnection system. Microelectronics Reliability 41(8): 1265-1272 (2001) |
| 1997 | ||
| 1 | EE | Satoshi Tazawa, Katsuyuki Ochiai, Seitaro Matsuo, Shigeru Nakajima: A high-speed 2-D topography simulator based on a pixel model. IEEE Trans. on CAD of Integrated Circuits and Systems 16(4): 386-397 (1997) |
| 1 | Daniel L. Barton | [3] |
| 2 | Seitaro Matsuo | [1] |
| 3 | Hide Murayama | [2] |
| 4 | Katsuyuki Ochiai | [1] |
| 5 | Satoshi Tazawa | [1] |
| 6 | Massimo Vanzi | [3] |
| 7 | Makoto Yamazaki | [2] |