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| 2005 | ||
|---|---|---|
| 1 | EE | G. Cassanelli, G. Mura, F. Cesaretti, Massimo Vanzi, Fausto Fantini: Reliability predictions in electronic industrial applications. Microelectronics Reliability 45(9-11): 1321-1326 (2005) |
| 1 | G. Cassanelli | [1] |
| 2 | Fausto Fantini | [1] |
| 3 | G. Mura | [1] |
| 4 | Massimo Vanzi | [1] |