| |
| 2002 | ||
|---|---|---|
| 2 | EE | T. Tomasi, I. De Munari, V. Lista, L. Gherardi, A. Righetti, M. Villa: Passive optical components: from degradation data to reliability assessment - preliminary results. Microelectronics Reliability 42(9-11): 1333-1338 (2002) |
| 1 | EE | C. Caprile, I. De Munari, M. Improntac, Simona Podda, A. Scorzoni, Massimo Vanzi: A specimen-current branching approach for FA of long Electromigration test lines. Microelectronics Reliability 42(9-11): 1715-1718 (2002) |
| 1 | C. Caprile | [1] |
| 2 | L. Gherardi | [2] |
| 3 | M. Improntac | [1] |
| 4 | V. Lista | [2] |
| 5 | Simona Podda | [1] |
| 6 | A. Righetti | [2] |
| 7 | A. Scorzoni | [1] |
| 8 | T. Tomasi | [2] |
| 9 | Massimo Vanzi | [1] |
| 10 | M. Villa | [2] |