| 2006 |
|---|
| 3 | EE | G. Cassanelli,
G. Mura,
Fausto Fantini,
Massimo Vanzi,
B. Plano:
Failure Analysis-assisted FMEA.
Microelectronics Reliability 46(9-11): 1795-1799 (2006) |
| 2005 |
|---|
| 2 | EE | G. Cassanelli,
G. Mura,
F. Cesaretti,
Massimo Vanzi,
Fausto Fantini:
Reliability predictions in electronic industrial applications.
Microelectronics Reliability 45(9-11): 1321-1326 (2005) |
| 2003 |
|---|
| 1 | EE | G. Cassanelli,
Fausto Fantini,
G. Serra,
S. Sgatti:
Reliability in automotive electronics: a case study applied to diesel engine control.
Microelectronics Reliability 43(9-11): 1411-1416 (2003) |
