G. Salmini
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2002
1
EE
Massimo Vanzi
, G. Salmini,
R. Pastorelli
,
S. Pessina
,
P. Furcas
: Reliability tests on WDM filters.
Microelectronics Reliability 42
(9-11): 1317-1321 (2002)
Coauthor
Index
1
P. Furcas
[
1
]
2
R. Pastorelli
[
1
]
3
S. Pessina
[
1
]
4
Massimo Vanzi
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
