B. Plano

2006
2	EE	G. Cassanelli, G. Mura, Fausto Fantini, Massimo Vanzi, B. Plano: Failure Analysis-assisted FMEA. Microelectronics Reliability 46(9-11): 1795-1799 (2006)
2003
1	EE	J.-Y. Delétage, F. J.-M. Verdier, B. Plano, Y. Deshayes, L. Béchou, Y. Danto: Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations. Microelectronics Reliability 43(7): 1137-1144 (2003)

Coauthor Index

1	L. Béchou	[1]
2	G. Cassanelli	[2]
3	Y. Danto	[1]
4	J.-Y. Delétage	[1]
5	Y. Deshayes	[1]
6	Fausto Fantini	[2]
7	G. Mura	[2]
8	Massimo Vanzi	[2]
9	F. J.-M. Verdier	[1]

Colors in the list of coauthors