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S. Pessina

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2002
1EEMassimo Vanzi, G. Salmini, R. Pastorelli, S. Pessina, P. Furcas: Reliability tests on WDM filters. Microelectronics Reliability 42(9-11): 1317-1321 (2002)

Coauthor Index

1P. Furcas [1]
2R. Pastorelli [1]
3G. Salmini [1]
4Massimo Vanzi [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)