| |
| 2006 | ||
|---|---|---|
| 1 | EE | M. Meneghini, Simona Podda, A. Morelli, Ruggero Pintus, L. Trevisanello, Gaudenzio Meneghesso, Massimo Vanzi, Enrico Zanoni: High brightness GaN LEDs degradation during dc and pulsed stress. Microelectronics Reliability 46(9-11): 1720-1724 (2006) |
| 1 | Gaudenzio Meneghesso | [1] |
| 2 | M. Meneghini | [1] |
| 3 | Ruggero Pintus | [1] |
| 4 | Simona Podda | [1] |
| 5 | L. Trevisanello | [1] |
| 6 | Massimo Vanzi | [1] |
| 7 | Enrico Zanoni | [1] |