2006 | ||
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1 | EE | M. Meneghini, Simona Podda, A. Morelli, Ruggero Pintus, L. Trevisanello, Gaudenzio Meneghesso, Massimo Vanzi, Enrico Zanoni: High brightness GaN LEDs degradation during dc and pulsed stress. Microelectronics Reliability 46(9-11): 1720-1724 (2006) |
1 | Gaudenzio Meneghesso | [1] |
2 | M. Meneghini | [1] |
3 | Ruggero Pintus | [1] |
4 | Simona Podda | [1] |
5 | L. Trevisanello | [1] |
6 | Massimo Vanzi | [1] |
7 | Enrico Zanoni | [1] |