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A. Morelli

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2006
1EEM. Meneghini, Simona Podda, A. Morelli, Ruggero Pintus, L. Trevisanello, Gaudenzio Meneghesso, Massimo Vanzi, Enrico Zanoni: High brightness GaN LEDs degradation during dc and pulsed stress. Microelectronics Reliability 46(9-11): 1720-1724 (2006)

Coauthor Index

1Gaudenzio Meneghesso [1]
2M. Meneghini [1]
3Ruggero Pintus [1]
4Simona Podda [1]
5L. Trevisanello [1]
6Massimo Vanzi [1]
7Enrico Zanoni [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)