| 2006 |
|---|
| 7 | EE | G. Cassanelli,
G. Mura,
Fausto Fantini,
Massimo Vanzi,
B. Plano:
Failure Analysis-assisted FMEA.
Microelectronics Reliability 46(9-11): 1795-1799 (2006) |
| 2005 |
|---|
| 6 | EE | G. Cassanelli,
G. Mura,
F. Cesaretti,
Massimo Vanzi,
Fausto Fantini:
Reliability predictions in electronic industrial applications.
Microelectronics Reliability 45(9-11): 1321-1326 (2005) |
| 2003 |
|---|
| 5 | EE | G. Cassanelli,
Fausto Fantini,
G. Serra,
S. Sgatti:
Reliability in automotive electronics: a case study applied to diesel engine control.
Microelectronics Reliability 43(9-11): 1411-1416 (2003) |
| 4 | EE | J. Kuchenbecker,
M. Borgarino,
M. Zeuner,
U. König,
R. Plana,
Fausto Fantini:
High Electric Field Induced Degradation of the DC Characteristics in Si/SiGe HEMT's.
Microelectronics Reliability 43(9-11): 1719-1723 (2003) |
| 2002 |
|---|
| 3 | EE | Fausto Fantini,
Massimo Vanzi:
Editorial.
Microelectronics Reliability 42(9-11): 1249 (2002) |
| 2 | EE | V. Lista,
P. Garbossa,
T. Tomasi,
M. Borgarino,
Fausto Fantini,
L. Gherardi,
A. Righetti,
M. Villa:
Degradation Based Long-Term Reliability Assessment for Electronic Components in Submarine Applications.
Microelectronics Reliability 42(9-11): 1389-1392 (2002) |
| 2001 |
|---|
| 1 | EE | M. Borgarino,
Roberto Menozzi,
D. Dieci,
L. Cattani,
Fausto Fantini:
Reliability physics of compound semiconductor transistors for microwave applications.
Microelectronics Reliability 41(1): 21-30 (2001) |
