2007 | ||
---|---|---|
3 | EE | Mridul Agarwal, Bipul C. Paul, Ming Zhang, Subhasish Mitra: Circuit Failure Prediction and Its Application to Transistor Aging. VTS 2007: 277-286 |
2006 | ||
2 | EE | Kanak Agarwal, Mridul Agarwal, Dennis Sylvester, David Blaauw: Statistical interconnect metrics for physical-design optimization. IEEE Trans. on CAD of Integrated Circuits and Systems 25(7): 1273-1288 (2006) |
2005 | ||
1 | EE | Mridul Agarwal, Kanak Agarwal, Dennis Sylvester, David Blaauw: Statistical modeling of cross-coupling effects in VLSI interconnects. ASP-DAC 2005: 503-506 |
1 | Kanak Agarwal | [1] [2] |
2 | David Blaauw (David T. Blaauw) | [1] [2] |
3 | Subhasish Mitra | [3] |
4 | Bipul Chandra Paul (Bipul C. Paul) | [3] |
5 | Dennis Sylvester | [1] [2] |
6 | Ming Zhang | [3] |