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Mridul Agarwal

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2007
3EEMridul Agarwal, Bipul C. Paul, Ming Zhang, Subhasish Mitra: Circuit Failure Prediction and Its Application to Transistor Aging. VTS 2007: 277-286
2006
2EEKanak Agarwal, Mridul Agarwal, Dennis Sylvester, David Blaauw: Statistical interconnect metrics for physical-design optimization. IEEE Trans. on CAD of Integrated Circuits and Systems 25(7): 1273-1288 (2006)
2005
1EEMridul Agarwal, Kanak Agarwal, Dennis Sylvester, David Blaauw: Statistical modeling of cross-coupling effects in VLSI interconnects. ASP-DAC 2005: 503-506

Coauthor Index

1Kanak Agarwal [1] [2]
2David Blaauw (David T. Blaauw) [1] [2]
3Subhasish Mitra [3]
4Bipul Chandra Paul (Bipul C. Paul) [3]
5Dennis Sylvester [1] [2]
6Ming Zhang [3]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)