| 2008 |
|---|
| 8 | EE | Muhammad Ashraful Alam,
Masud Hasan:
Computing Nice Projections of Convex Polyhedra.
WALCOM 2008: 111-119 |
| 2007 |
|---|
| 7 | EE | Kunhyuk Kang,
Kee-Jong Kim,
Ahmad E. Islam,
Muhammad Ashraful Alam,
Kaushik Roy:
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement.
DAC 2007: 358-363 |
| 6 | EE | Kunhyuk Kang,
Sang Phill Park,
Kaushik Roy,
Muhammad Ashraful Alam:
Estimation of statistical variation in temporal NBTI degradation and its impact on lifetime circuit performance.
ICCAD 2007: 730-734 |
| 5 | EE | Kunhyuk Kang,
Haldun Kufluoglu,
Kaushik Roy,
Muhammad Ashraful Alam:
Impact of Negative-Bias Temperature Instability in Nanoscale SRAM Array: Modeling and Analysis.
IEEE Trans. on CAD of Integrated Circuits and Systems 26(10): 1770-1781 (2007) |
| 4 | EE | Bipul Chandra Paul,
Kunhyuk Kang,
Haldun Kufluoglu,
Muhammad Ashraful Alam,
Kaushik Roy:
Negative Bias Temperature Instability: Estimation and Design for Improved Reliability of Nanoscale Circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 26(4): 743-751 (2007) |
| 2006 |
|---|
| 3 | EE | Bipul Chandra Paul,
Kunhyuk Kang,
Haldun Kufluoglu,
Muhammad Ashraful Alam,
Kaushik Roy:
Temporal performance degradation under NBTI: estimation and design for improved reliability of nanoscale circuits.
DATE 2006: 780-785 |
| 2 | EE | Kunhyuk Kang,
Haldun Kufluoglu,
Muhammad Ashraful Alam,
Kaushik Roy:
Efficient Transistor-Level Sizing Technique under Temporal Performance Degradation due to NBTI.
ICCD 2006 |
| 2004 |
|---|
| 1 | EE | Muhammad Ashraful Alam:
Software Security in Bangladesh with .NET Framework: A Roadmap.
ITCC (2) 2004: 438-443 |
