| 1990 |
|---|
| 3 | EE | Robert W. Bassett,
Barry J. Butkus,
Stephen L. Dingle,
Marc R. Faucher,
Pamela S. Gillis,
Jeannie H. Panner,
John G. Petrovick,
Donald L. Wheater:
Low-Cost Testing of High-Density Logic Components.
IEEE Design & Test of Computers 7(2): 15-28 (1990) |
| 1989 |
|---|
| 2 | | Robert W. Bassett,
Barry J. Butkus,
Stephen L. Dingle,
Marc R. Faucher,
Pamela S. Gillis,
Jeannie H. Panner,
John G. Petrovick,
Donald L. Wheater:
Low Cost Testing of High Density Logic Components.
ITC 1989: 550-557 |
| 1983 |
|---|
| 1 | | Marc R. Faucher:
Pattern Recognition of Bit Fail Maps.
ITC 1983: 460-463 |
