| 2003 |
|---|
| 9 | EE | Bernd Könemann:
Care Bit Density and Test Cube Clusters: Multi-Level Compression Opportunities.
ICCD 2003: 320- |
| 2002 |
|---|
| 8 | EE | Carl Barnhart,
Vanessa Brunkhorst,
Frank Distler,
Owen Farnsworth,
Andrew Ferko,
Brion L. Keller,
David Scott,
Bernd Könemann,
Takeshi Onodera:
Extending OPMISR beyond 10x Scan Test Efficiency.
IEEE Design & Test of Computers 19(5): 65-72 (2002) |
| 2001 |
|---|
| 7 | EE | Bernd Könemann,
Carl Barnhart,
Brion L. Keller,
Thomas J. Snethen,
Owen Farnsworth,
Donald L. Wheater:
A SmartBIST Variant with Guaranteed Encoding.
Asian Test Symposium 2001: 325- |
| 6 | | Carl Barnhart,
Vanessa Brunkhorst,
Frank Distler,
Owen Farnsworth,
Brion L. Keller,
Bernd Könemann,
Andrej Ferko:
OPMISR: the foundation for compressed ATPG vectors.
ITC 2001: 748-757 |
| 1996 |
|---|
| 5 | | Bernd Könemann,
Ben Bennetts,
Najmi T. Jarwala,
Benoit Nadeau-Dostie:
Built-In Self-Test: Assuring System Integrity.
IEEE Computer 29(11): 39-45 (1996) |
| 1993 |
|---|
| 4 | | Kenneth D. Wagner,
Bernd Könemann:
Testable Programmable Digital Clock Pulse Control Elements.
ITC 1993: 902-909 |
| 1992 |
|---|
| 3 | | Yaron Aizenbud,
Paul Chang,
Moshe Leibowitz,
Dave Smith,
Bernd Könemann,
Vijay S. Iyengar,
Barry K. Rosen:
AC Test Quality: Beyond Transition Fault Coverage.
ITC 1992: 568-577 |
| 2 | | Bernd Könemann,
J. Barlow,
Paul Chang,
R. Gabrielson,
C. Goertz,
Brion L. Keller,
Kevin McCauley,
J. Tischer,
Vijay S. Iyengar,
Barry K. Rosen,
T. Williams:
Delay Test: The Next Frontier for LSSD Test Systems.
ITC 1992: 578-587 |
| 1 | | Bernd Könemann,
Phil Noto:
A Test Generation Methodology for High-Performance Computer Chips and Modules.
ITC 1992: 826-833 |
