| 2002 |
|---|
| 4 | EE | John Gatej,
Lee Song,
Carol Pyron,
Rajesh Raina,
Tom Munns:
valuating ATE Features in Terms of Test Escape Rates and Other Cost of Test Culprits.
ITC 2002: 1040-1049 |
| 3 | EE | Bill Bottoms,
Lee Song,
Paul Patton,
Wilhelm Radermacher:
A Successful DFT Tester: What Will It Look Like? Is DFT Tester a Logical Next Step in ATE Evolution?
VTS 2002: 129-132 |
| 2 | EE | Adam Osseiran,
William De Wilkins,
Barry Baril,
Sassan Tabatabaei,
Fidel Muradali,
Ken Posse,
Lee Song:
Analog and Mixed Signal BIST: Too Much, Too Little, Too Late?
VTS 2002: 175-176 |
| 1 | EE | Lee Song,
Rudy Garcia,
Andrew Levy,
Donald L. Wheater:
A Successful DFT Tester: What Will It Look Like? Is Revolution in Test Approaches Required?
VTS 2002: 87-90 |
