Kuniaki Kishida

1989
2		Kazumi Hatayama, Mitsuji Ikeda, Terumine Hayashi, Masahiro Takakura, Kuniaki Kishida, Shun Ishiyama: Enhanced Delay Test Generator for High-Speed Logic LSIs. ITC 1989: 161-165
1986
1	EE	Kuniaki Kishida, F. Shirotori, Y. Ikemoto, Shun Ishiyama, Terumine Hayashi: A delay test system for high speed logic LSI's. DAC 1986: 786-790

Coauthor Index

1	Kazumi Hatayama	[2]
2	Terumine Hayashi	[1] [2]
3	Mitsuji Ikeda	[2]
4	Y. Ikemoto	[1]
5	Shun Ishiyama	[1] [2]
6	F. Shirotori	[1]
7	Masahiro Takakura	[2]