| |
| 2003 | ||
|---|---|---|
| 1 | EE | Tsuyoshi Shinogi, Yuki Yamada, Terumine Hayashi, Tomohiro Yoshikawa, Shinji Tsuruoka: Between-Core Vector Overlapping for Test Cost Reduction in Core Testing. Asian Test Symposium 2003: 268-273 |
| 1 | Terumine Hayashi | [1] |
| 2 | Tsuyoshi Shinogi | [1] |
| 3 | Shinji Tsuruoka | [1] |
| 4 | Tomohiro Yoshikawa | [1] |