Kazunori Hikone

1997
3	EE	Kazumi Hatayama, Kazunori Hikone, T. Miyazaki, H. Yamada: A practical approach to instruction-based test generation for functional modules of VLSI processors. VTS 1997: 17-23
1992
2		Kazumi Hatayama, Kazunori Hikone, Mitsuji Ikeda, Terumine Hayashi: Sequential Test Generation Based on Real-Value Logic. ITC 1992: 41-48
1988
1		Hideo Fujiwara, Osamu Fujisawa, Kazunori Hikone: Enhancing Random-Pattern Coverage of Programmable Logic Arrays via Masking Technique. ITC 1988: 642-648

Coauthor Index

1	Osamu Fujisawa	[1]
2	Hideo Fujiwara	[1]
3	Kazumi Hatayama	[2] [3]
4	Terumine Hayashi	[2]
5	Mitsuji Ikeda	[2]
6	T. Miyazaki	[3]
7	H. Yamada	[3]

Colors in the list of coauthors